203 search results - page 33 / 41 » Test Pattern Generator for Delay Faults |
DDECS
2007
IEEE
15 years 8 months ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
140
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SIGSOFT
2006
ACM
15 years 7 months ago
2006
ACM
Unit test cases are focused and efficient. System tests are effective at exercising complex usage patterns. Differential unit tests (DUT) are a hybrid of unit and system tests. T...
113
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CONSTRAINTS
2007
15 years 1 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
102
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AAAI
2008
15 years 4 months ago
2008
Model-Based Diagnosis (MBD) typically focuses on diagnoses, minimal under some minimality criterion, e.g., the minimal-cardinality set of faulty components that explain an observa...
ATS
2009
IEEE
15 years 8 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...