203 search results - page 35 / 41 » Test Pattern Generator for Delay Faults |
175
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CP
2009
Springer
16 years 11 days ago
2009
Springer
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
113
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SRDS
1993
IEEE
15 years 3 months ago
1993
IEEE
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
ASPDAC
2005
ACM
15 years 1 months ago
2005
ACM
Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
ITC
2000
IEEE
15 years 3 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
110
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ICCAD
2002
IEEE
15 years 8 months ago
2002
IEEE
In this survey, we outline basic SAT- and ATPGprocedures as well as their applications in formal hardware verification. We attempt to give the reader a trace trough literature and...