Sciweavers

112 search results - page 8 / 23
» Test Sequencing in Complex Manufacturing Systems
Sort
View
WSC
2004
14 years 10 months ago
An Event Graph Based Simulation and Scheduling Analysis of Multi-Cluster Tools
Simulation methods are extensively used in modeling complex scheduling problems. However, traditional layout of simulation models can become complicated when they are used to find...
Shengwei Ding, Jingang Yi
TIT
2008
102views more  TIT 2008»
14 years 9 months ago
On Low-Complexity Maximum-Likelihood Decoding of Convolutional Codes
Abstract--This letter considers the average complexity of maximum-likelihood (ML) decoding of convolutional codes. ML decoding can be modeled as finding the most probable path take...
Jie Luo
AIPS
2000
14 years 10 months ago
Plan Generation for GUI Testing
Graphical user interfaces (GUIs) have become nearly ubiquitous as a means of interacting with software systems. GUIs are typically highly complex pieces of software, and testing t...
Atif M. Memon, Martha E. Pollack, Mary Lou Soffa
ICCAD
2000
IEEE
95views Hardware» more  ICCAD 2000»
15 years 1 months ago
Test of Future System-on-Chips
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...
Yervant Zorian, Sujit Dey, Mike Rodgers
ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
15 years 3 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen