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AICCSA
2001
IEEE
172views Hardware» more  AICCSA 2001»
15 years 1 months ago
Methods and Metrics for Selective Regression Testing
In corrective maintenance, selective regression testing includes test selection from previously run test suite and test coverage identification. We propose three reductionbased re...
Rami Bahsoon, Nashat Mansour
JAVACARD
2000
15 years 1 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
ECBS
2010
IEEE
230views Hardware» more  ECBS 2010»
15 years 24 days ago
A Model-Based Regression Testing Approach for Evolving Software Systems with Flexible Tool Support
Model-based selective regression testing promises reduction in cost and labour by selecting a subset of the test suite corresponding to the modifications after system evolution. H...
Qurat-ul-ann Farooq, Muhammad Zohaib Z. Iqbal, Zaf...
ISVLSI
2003
IEEE
157views VLSI» more  ISVLSI 2003»
15 years 2 months ago
Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...
Shalini Ghosh, Sugato Basu, Nur A. Touba
90
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FMICS
2006
Springer
15 years 1 months ago
Model-Based Testing of a WAP Gateway: An Industrial Case-Study
Abstract. We present experiences from a case study where a model-based approach to black-box testing is applied to verify that a Wireless Application Protocol (WAP) gateway conform...
Anders Hessel, Paul Pettersson