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search results - page 104 / 1171
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Test generation and minimization with
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FATES
2004
Springer
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Software Engineering
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Symbolic Test Case Generation for Primitive Recursive Functions
15 years 6 months ago
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Achim D. Brucker, Burkhart Wolff
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FMCO
2004
Springer
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Formal Methods
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A Theory of Predicate-Complete Test Coverage and Generation
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research.microsoft.com
Thomas Ball
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DATE
2003
IEEE
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Hardware
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Fully Automatic Test Program Generation for Microprocessor Cores
15 years 6 months ago
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Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
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DATE
2003
IEEE
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Test Generation for Acyclic Sequential Circuits with Single Stuck-at Fault Combinational ATPG
15 years 6 months ago
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Hideyuki Ichihara, Tomoo Inoue
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2003
IEEE
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RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
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Marcelino B. Santos, José M. Fernandes, Isa...
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