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DATE
2003
IEEE
109views Hardware» more  DATE 2003»
15 years 6 months ago
Fully Automatic Test Program Generation for Microprocessor Cores
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
DATE
2003
IEEE
62views Hardware» more  DATE 2003»
15 years 6 months ago
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
Marcelino B. Santos, José M. Fernandes, Isa...