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DFT
2003
IEEE
81views VLSI» more  DFT 2003»
15 years 6 months ago
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment
Fengming Zhang, Young-Jun Lee, T. Kane, Luca Schia...
KBSE
2003
IEEE
15 years 6 months ago
Automated Requirements-based Generation of Test Cases for Product Families
Clémentine Nebut, Simon Pickin, Yves Le Tra...
TAP
2010
Springer
92views Hardware» more  TAP 2010»
15 years 6 months ago
Generating Regression Unit Tests Using a Combination of Verification and Capture & Replay
Christoph Gladisch, Shmuel S. Tyszberowicz, Bernha...
DATE
2002
IEEE
88views Hardware» more  DATE 2002»
15 years 6 months ago
Internet-Based Collaborative Test Generation with MOSCITO
André Schneider, Karl-Heinz Diener, Eero Iv...
DFT
2002
IEEE
108views VLSI» more  DFT 2002»
15 years 6 months ago
A Test-Vector Generation Methodology for Crosstalk Noise Faults
Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park