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ATS
2000
IEEE
86views Hardware» more  ATS 2000»
15 years 5 months ago
An adjacency-based test pattern generator for low power BIST design
Patrick Girard, Loïs Guiller, Christian Landr...
ASPDAC
2000
ACM
102views Hardware» more  ASPDAC 2000»
15 years 5 months ago
Causality based generation of directed test cases
Nina Saxena, Jacob A. Abraham, Avijit Saha