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ISMVL
1994
IEEE
94views Hardware» more  ISMVL 1994»
15 years 5 months ago
Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits
Elena Dubrova, Dilian Gurov, Jon C. Muzio
AMOST
2007
ACM
15 years 5 months ago
Test purpose generation in an industrial application
Bernhard K. Aichernig, Martin Weiglhofer, Bernhard...
CASSIS
2004
Springer
15 years 5 months ago
Mastering Test Generation from Smart Card Software Formal Models
Fabrice Bouquet, Bruno Legeard, Fabien Peureux, Er...
COMPSAC
2004
IEEE
15 years 5 months ago
Generating Regression Tests via Model Checking
Lihua Xu, Marcio S. Dias, Debra J. Richardson