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search results - page 110 / 1171
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Test generation and minimization with
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ISMVL
1994
IEEE
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Hardware
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ISMVL 1994
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Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits
15 years 5 months ago
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web.it.kth.se
Elena Dubrova, Dilian Gurov, Jon C. Muzio
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165
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AMOST
2007
ACM
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Software Engineering
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Test purpose generation in an industrial application
15 years 5 months ago
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www.ist.tugraz.at
Bernhard K. Aichernig, Martin Weiglhofer, Bernhard...
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112
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AMOST
2007
ACM
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Model-based regression test suite generation using dependence analysis
15 years 5 months ago
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www.site.uottawa.ca
Yanping Chen, Robert L. Probert, Hasan Ural
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CASSIS
2004
Springer
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Human Computer Interaction
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Mastering Test Generation from Smart Card Software Formal Models
15 years 5 months ago
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www-sop.inria.fr
Fabrice Bouquet, Bruno Legeard, Fabien Peureux, Er...
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103
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COMPSAC
2004
IEEE
138
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Software Engineering
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Generating Regression Tests via Model Checking
15 years 5 months ago
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eagle.csie.ntut.edu.tw
Lihua Xu, Marcio S. Dias, Debra J. Richardson
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