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ASPDAC
2008
ACM
78views Hardware» more  ASPDAC 2008»
15 years 3 months ago
Robust test generation for power supply noise induced path delay faults
Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li
ISSTA
2010
ACM
15 years 3 months ago
Generating test cases for specification mining
Valentin Dallmeier, Nikolai Knopp, Christoph Mallo...
DAGSTUHL
2004
15 years 2 months ago
Tools for Test Case Generation
Axel Belinfante, Lars Frantzen, Christian Schallha...