5855 search results - page 118 / 1171 » Test generation and minimization with |
146
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ESOP
2012
Springer
13 years 9 months ago
2012
Springer
Abstract. MapReduce, being inspired by the map and reduce primitives available in many functional languages, is the de facto standard for large scale data-intensive parallel progra...
104
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ICCAD
2001
IEEE
15 years 10 months ago
2001
IEEE
1 We propose an integrated technique for extensive optimization of the final test solution for System-on-Chip using Simulated Annealing. The produced results from the technique ar...
95
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EDBT
2008
ACM
16 years 1 months ago
2008
ACM
Redundancy and minimization of queries are investigated in a well known fragment of XPath that includes child and descendant edges, branches, wildcards, and multiple output nodes....
104
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ICTAI
2002
IEEE
15 years 6 months ago
2002
IEEE
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...