5855 search results - page 121 / 1171 » Test generation and minimization with |
ATS
2002
IEEE
15 years 6 months ago
2002
IEEE
We propose a methodology that examines design modules and identifies appropriate vector justification and response propagation requirements for hierarchical test. Based on a cel...
126
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DSD
2005
IEEE
15 years 7 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
101
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COMCOM
1999
15 years 1 months ago
1999
We present a problem of commonly used characterization sequences (CS) for the protocol conformance testing and propose a new test sequence to resolve the problem. The proposed tes...
109
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DATE
2002
IEEE
15 years 6 months ago
2002
IEEE
Production test costs for today’s RF circuits are rapidly escalating. Two factors are responsible for this cost escalation: (a) the high cost of RF ATEs and (b) long test times ...
MFCS
2001
Springer
15 years 6 months ago
2001
Springer
In this paper we consider the question of whether NC0 circuits can generate pseudorandom distributions. While we leave the general question unanswered, we show • Generators compu...