5855 search results - page 128 / 1171 » Test generation and minimization with |
ICCAD
2004
IEEE
15 years 10 months ago
2004
IEEE
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
114
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SIGSOFT
2007
ACM
16 years 2 months ago
2007
ACM
Regression testing, as it's commonly practiced, is unsound due to inconsistent test repair and test addition. This paper presents a new technique, differential testing, that ...
103
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MTV
2007
IEEE
15 years 7 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
ICML
2006
IEEE
16 years 2 months ago
2006
IEEE
In medical diagnosis, doctors often have to order sets of medical tests in sequence in order to make an accurate diagnosis of patient diseases. While doing so they have to make a ...
126
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DATE
2008
IEEE
2008
IEEE
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
15 years 3 months ago
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...