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131
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ITC
1996
IEEE
15 years 5 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
115
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FATES
2003
Springer
15 years 6 months ago
2003
Springer
Use of model-checking approaches for test generation from requirement models have been proposed by several researchers. These approaches leverage the witness (or counter-example) ...
107
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DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
– In this paper, we present an open architecture Virtual Test Environment (VTE) which can be easily integrated into various modularized Automatic Test Systems (ATS) compliant to ...
118
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ACSC
2004
IEEE
15 years 5 months ago
2004
IEEE
The collision test is an important statistical test for rejecting poor random number generators. The test simulates the throwing of balls randomly into urns. A problem in applying...
119
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COMPSAC
1996
IEEE
15 years 5 months ago
1996
IEEE
This paper discusses how conventional testing criteria such as branch coverage can be applied for the testing of member functions inside a class. To support such testing technique...