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ETS
2009
IEEE
79views Hardware» more  ETS 2009»
14 years 11 months ago
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
Michael A. Kochte, Christian G. Zoellin, Hans-Joac...
IPCO
2001
95views Optimization» more  IPCO 2001»
15 years 2 months ago
Bisubmodular Function Minimization
This paper presents the first combinatorial polynomial algorithm for minimizing bisubmodular functions, extending the scaling algorithm for submodular function minimization due to ...
Satoru Fujishige, Satoru Iwata
ESA
2005
Springer
155views Algorithms» more  ESA 2005»
15 years 7 months ago
A Loopless Gray Code for Minimal Signed-Binary Representations
A string . . . a2a1a0 over the alphabet {−1, 0, 1} is said to be a minimal signed-binary representation of an integer n if n =   k≥0 ak2k and the number of non-zero digits is ...
Gurmeet Singh Manku, Joe Sawada
ICSEA
2007
IEEE
15 years 7 months ago
A Novel Framework for Test Domain Reduction using Extended Finite State Machine
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...
Nutchakorn Ngamsaowaros, Peraphon Sophatsathit
CVPR
2007
IEEE
15 years 5 months ago
Minimal Solutions for Panoramic Stitching
This paper presents minimal solutions for the geometric parameters of a camera rotating about its optical centre. In particular we present new 2 and 3 point solutions for the homo...
Matthew Brown, Richard I. Hartley, David Nist&eacu...