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GLVLSI
2005
IEEE
15 years 7 months ago
2005
IEEE
We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundari...
117
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APLAS
2003
ACM
15 years 5 months ago
2003
ACM
We investigate how to automatically verify that resources such as files are not used improperly or unsafely by a program. We employ a mixture of compile-time analysis and run-time ...
104
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DDECS
2007
IEEE
15 years 8 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
106
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ISSRE
2008
IEEE
15 years 8 months ago
2008
IEEE
As software systems evolve, the size of their test suites grow due to added functionality and customer-detected defects. Many of these tests may contain redundant elements with pr...
106
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SOQUA
2004
15 years 2 months ago
2004
: In a component testing approach for evaluating system reliability, one tests units of the components or subsystems that make up a larger system in order to draw conclusions about...