5855 search results - page 143 / 1171 » Test generation and minimization with |
ITC
1989
IEEE
15 years 5 months ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
105
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VTS
2005
IEEE
15 years 7 months ago
2005
IEEE
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
123
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JIPS
2010
14 years 8 months ago
2010
Test scenarios can be derived based on some system models for requirements validation purposes. Model-based test suite reduction aims to provide a smaller set of test scenarios whi...
125
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AWCC
2004
Springer
15 years 7 months ago
2004
Springer
This paper proposes progressive group testing techniques to test large number of Web services (WS) available on Internet. At the unit testing level, the WS with the same functional...
121
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ICSM
2005
IEEE
15 years 7 months ago
2005
IEEE
Automated cost-effective test strategies are needed to provide reliable, secure, and usable web applications. As a software maintainer updates an application, test cases must accu...