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ITC
1998
IEEE
95views Hardware» more  ITC 1998»
15 years 1 months ago
Native mode functional test generation for processors with applications to self test and design validation
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Jian Shen, Jacob A. Abraham
APSEC
1998
IEEE
15 years 1 months ago
An Automatic Test Case Generator Derived from State-Based Testing
This paper describes an automated approach to generating test cases for an object-oriented class. The approach is derived from state-based testing methods and refers to a state ma...
Bor-Yuan Tsai, Simon Stobart, Norman Parrington, I...
DELTA
2008
IEEE
15 years 4 months ago
AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis
Re-using embedded resources for implementing builtin self test mechanisms allows test cost reduction. In this paper we demonstrate how to implement costefficient built-in self tes...
M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre
QSIC
2006
IEEE
15 years 3 months ago
A Test Data Generation Tool for Unit Testing of C Programs
This paper describes a prototype tool, called SimC, which automatically generates test data for unit testing of C programs. The tool symbolically simulates the execution of the gi...
Zhongxing Xu, Jian Zhang
ATAL
2008
Springer
14 years 11 months ago
eCAT: a tool for automating test cases generation and execution in testing multi-agent systems
We introduce eCAT, a tool that supports deriving test cases semi-automatically from goal-based analysis diagrams, generates meaningful test inputs based on agent interaction ontol...
Duy Cu Nguyen, Anna Perini, Paolo Tonella