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115
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ECOOP
2006
Springer
15 years 5 months ago
2006
Springer
A test case consists of two parts: a test input to exercise the program under test and a test oracle to check the correctness of the test execution. A test oracle is often in the f...
115
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DAC
2006
ACM
16 years 2 months ago
2006
ACM
The gain-based technology mapping paradigm has been successfully employed for finding minimum delay and minimum area mappings. However, existing gain-based technology mappers fail...
102
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FASE
2009
Springer
15 years 8 months ago
2009
Springer
Abstract. Bounded-exhaustive testing is an automated testing methodology that checks the code under test for all inputs within given bounds: first the user describes a set of test...
114
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ICCAD
1994
IEEE
15 years 5 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
CORR
2010
Springer
15 years 1 months ago
2010
Springer
In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...