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QSIC
2005
IEEE
15 years 6 months ago
2005
IEEE
Fault-based testing is a technique where testers anticipate errors in a system under test in order to assess or generate test cases. The idea is to have enough test cases capable ...
DATE
2008
IEEE
15 years 7 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
ITC
2003
IEEE
15 years 6 months ago
2003
IEEE
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes....
112
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ITC
2003
IEEE
15 years 6 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
116
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ASPDAC
2006
ACM
15 years 7 months ago
2006
ACM
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...