5855 search results - page 42 / 1171 » Test generation and minimization with |
110
click to vote
FATES
2004
Springer
15 years 6 months ago
2004
Springer
We present an extension of Tretmans’ theory and algorithm for test generation for input-output transition systems to real-time systems. Our treatment is based on an operational i...
100
click to vote
ICCAD
2000
IEEE
15 years 5 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
COMPSAC
2003
IEEE
15 years 6 months ago
2003
IEEE
One of the important tasks during software testing is the generation of test cases. Various approaches have been proposed to automate this task. The approaches available, however,...
100
click to vote
DATE
2000
IEEE
15 years 5 months ago
2000
IEEE
We describe a method for on-chip generation of weighted test sequences for synchronous sequential circuits. For combinational circuits, three weights, 0, 0.5 and 1, are sufficien...
100
click to vote
DATE
1997
IEEE
15 years 5 months ago
1997
IEEE
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design....