5855 search results - page 48 / 1171 » Test generation and minimization with |
GI
2007
Springer
15 years 7 months ago
2007
Springer
: In addition to the growing complexity of software systems, test effort takes increasing amounts of time and correspondingly more money. Testing costs may be reduced without compr...
109
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VTS
2008
IEEE
15 years 7 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
119
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ATS
1996
IEEE
15 years 5 months ago
1996
IEEE
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
111
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ICST
2008
IEEE
15 years 7 months ago
2008
IEEE
In this paper, we deal with coverage criteria for boundary testing. We focus on the automatic generation of boundary tests based on OCL expressions and evaluate the quality of the...
100
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DEBU
2008
15 years 1 months ago
2008
Testing is one of the most expensive and time consuming activities in the software development cycle. In order to reduce the cost and the time to market, many approaches to automa...