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GPCE
2003
Springer
15 years 6 months ago
A Case for Test-Code Generation in Model-Driven Systems
A primary goal of generative programming and model-driven ent is to raise the level of abstraction at which designers and developers interact with the software systems they are bui...
Matthew J. Rutherford, Alexander L. Wolf
KBSE
2008
IEEE
15 years 7 months ago
An Automated Test Code Generation Method for Web Applications using Activity Oriented Approach
—Automated tests are important for Web applications as they grow more complex day by day. Web application testing frameworks have emerged to help satisfy this need. However, used...
David A. Turner, Moonju Park, Jaehwan Kim, Jinseok...
EURODAC
1994
IEEE
148views VHDL» more  EURODAC 1994»
15 years 5 months ago
BiTeS: a BDD based test pattern generator for strong robust path delay faults
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
Rolf Drechsler
GLVLSI
2006
IEEE
95views VLSI» more  GLVLSI 2006»
15 years 7 months ago
Test generation using SAT-based bounded model checking for validation of pipelined processors
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
Heon-Mo Koo, Prabhat Mishra
VTS
1996
IEEE
126views Hardware» more  VTS 1996»
15 years 5 months ago
Automatic test generation using genetically-engineered distinguishing sequences
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...