5855 search results - page 52 / 1171 » Test generation and minimization with |
FLAIRS
2007
15 years 3 months ago
2007
In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In co...
SDL
2001
15 years 2 months ago
2001
The purpose of this paper is to describe how computer-aided test generation methods can benefit from the time features and extensions to MSC, SDL and TTCN which are either already ...
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VTS
2000
IEEE
15 years 5 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
AMFG
2005
IEEE
15 years 7 months ago
2005
IEEE
Pose variations, especially large out-of-plane rotations, make face recognition a difficult problem. In this paper, we propose an algorithm that uses a single input image to accura...
TCAD
2010
14 years 8 months ago
2010
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...