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INFORMATICALT
2007
43views more  INFORMATICALT 2007»
15 years 1 months ago
Functional Test Generation Based on Combined Random and Deterministic Search Methods
Abstract. The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for ...
Eduardas Bareisa, Vacius Jusas, Kestutis Motiejuna...
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
15 years 7 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
TRUSTBUS
2004
Springer
15 years 6 months ago
Privacy Preserving Data Generation for Database Application Performance Testing
Abstract. Synthetic data plays an important role in software testing. In this paper, we initiate the study of synthetic data generation models for the purpose of application softwa...
Yongge Wang, Xintao Wu, Yuliang Zheng
DAC
2001
ACM
16 years 2 months ago
Semi-Formal Test Generation with Genevieve
This paper describes the first application of the Genevieve test generation methodology. The Genevieve approach uses semi-formal techniques derived from "model-checking"...
Julia Dushina, Mike Benjamin, Daniel Geist
DATE
2007
IEEE
84views Hardware» more  DATE 2007»
15 years 7 months ago
On test generation by input cube avoidance
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
Irith Pomeranz, Sudhakar M. Reddy