5855 search results - page 54 / 1171 » Test generation and minimization with |
106
click to vote
KBSE
1998
IEEE
15 years 5 months ago
1998
IEEE
Structural testing criteria are mandated in many software development standards and guidelines. The process of generating test-data to achieve 100 coverage of a given structural c...
119
click to vote
DATE
2004
IEEE
15 years 5 months ago
2004
IEEE
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has prop...
133
click to vote
ISQED
2002
IEEE
15 years 6 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
134
click to vote
ITC
1993
IEEE
15 years 5 months ago
1993
IEEE
This paper presents an efficient approach to generate tests for gate delay faults. Unlike other known algorithms which try to generate a 'good' delay test the presented ...
105
click to vote
VLSID
2002
IEEE
16 years 1 months ago
2002
IEEE
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...