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VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
16 years 1 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen
ICSEA
2007
IEEE
15 years 7 months ago
Test Data Generation from UML State Machine Diagrams using GAs
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
Chartchai Doungsa-ard, Keshav P. Dahal, M. Alamgir...
VTS
1998
IEEE
124views Hardware» more  VTS 1998»
15 years 5 months ago
A Test Pattern Generation Methodology for Low-Power Consumption
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
AOSE
2008
Springer
15 years 3 months ago
Experimental Evaluation of Ontology-Based Test Generation for Multi-agent Systems
Abstract. Software agents are a promising technology for today's complex, distributed systems. Methodologies and techniques that address testing and reliability of multi agent...
Cu D. Nguyen, Anna Perini, Paolo Tonella
DATE
1999
IEEE
111views Hardware» more  DATE 1999»
15 years 5 months ago
Sequential Circuit Test Generation Using Decision Diagram Models
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
Jaan Raik, Raimund Ubar