5855 search results - page 60 / 1171 » Test generation and minimization with |
122
click to vote
EVOW
2008
Springer
15 years 3 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
115
click to vote
DAC
2003
ACM
15 years 6 months ago
2003
ACM
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
126
click to vote
DATE
1999
IEEE
15 years 5 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
122
click to vote
DATE
1997
IEEE
15 years 5 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
ACL
2006
15 years 2 months ago
2006
This paper introduces a method for the semi-automatic generation of grammar test items by applying Natural Language Processing (NLP) techniques. Based on manually-designed pattern...