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KBSE
1997
IEEE
15 years 5 months ago
Genetic Algorithms for Dynamic Test Data Generation
In software testing, it is often desirable to find test inputs that exercise specific program features. To find these inputs by hand is extremely time-consuming, especially whe...
Christoph C. Michael, Gary McGraw, Michael Schatz,...
VLSID
1993
IEEE
136views VLSI» more  VLSID 1993»
15 years 5 months ago
A Simulation-Based Test Generation Scheme Using Genetic Algorithms
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
M. Srinivas, Lalit M. Patnaik
ICSE
2007
IEEE-ACM
16 years 1 months ago
Feedback-Directed Random Test Generation
We present a technique that improves random test generation by incorporating feedback obtained from executing test inputs as they are created. Our technique builds inputs incremen...
Carlos Pacheco, Shuvendu K. Lahiri, Michael D. Ern...
ICSE
2007
IEEE-ACM
16 years 1 months ago
Using GUI Run-Time State as Feedback to Generate Test Cases
This paper presents a new automated model-driven technique to generate test cases by using feedback from the execution of a "seed test suite" on an application under tes...
Xun Yuan, Atif M. Memon
ICSE
2009
IEEE-ACM
15 years 8 months ago
Guided path exploration for regression test generation
Regression test generation aims at generating a test suite that can detect behavioral differences between the original and the modified versions of a program. Regression test gen...
Kunal Taneja, Tao Xie, Nikolai Tillmann, Jonathan ...