5855 search results - page 63 / 1171 » Test generation and minimization with |
118
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KBSE
2009
IEEE
15 years 8 months ago
2009
IEEE
Abstract—Test coverage such as branch coverage is commonly measured to assess the sufficiency of test inputs. To reduce tedious manual efforts in generating high-covering test i...
106
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SIGSOFT
2007
ACM
16 years 2 months ago
2007
ACM
There has recently been a great deal of interest in search? based test data generation, with many local and global search algorithms being proposed. However, to date, there has be...
210
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ISSTA
2004
ACM
15 years 6 months ago
2004
ACM
We show how model checking and symbolic execution can be used to generate test inputs to achieve structural coverage of code that manipulates complex data structures. We focus on ...
121
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DATE
2005
IEEE
15 years 7 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
106
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ICS
1998
Tsinghua U.
15 years 5 months ago
1998
Tsinghua U.
Parallel computers are now commonly used for computational science and engineering, and many applications in these areas use random number generators. For some applications, such ...