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SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
15 years 7 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
TSE
2010
197views more  TSE 2010»
14 years 8 months ago
A Genetic Algorithm-Based Stress Test Requirements Generator Tool and Its Empirical Evaluation
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
Vahid Garousi
DATE
2006
IEEE
98views Hardware» more  DATE 2006»
15 years 7 months ago
Test generation for combinational quantum cellular automata (QCA) circuits
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
Pallav Gupta, Niraj K. Jha, Loganathan Lingappan
ET
1998
52views more  ET 1998»
15 years 1 months ago
Scalable Test Generators for High-Speed Datapath Circuits
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
Hussain Al-Asaad, John P. Hayes, Brian T. Murray
INLG
2010
Springer
14 years 11 months ago
Generating Natural Language Descriptions of Z Test Cases
Critical software most often requires an independent validation and verification (IVV). IVV is usually performed by domain experts, who are not familiar with specific, many times ...
Maximiliano Cristiá, Brian Plüss