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102
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DATE
2005
IEEE
15 years 7 months ago
2005
IEEE
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
SIGSOFT
2007
ACM
16 years 2 months ago
2007
ACM
We present novel algorithms for parallel testing of code that takes structurally complex test inputs. The algorithms build on the Korat algorithm for constraint-based generation o...
116
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VLSID
2007
IEEE
16 years 1 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
ICST
2008
IEEE
15 years 7 months ago
2008
IEEE
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
EUROGP
2003
Springer
15 years 6 months ago
2003
Springer
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...