5855 search results - page 73 / 1171 » Test generation and minimization with |
ICSE
2007
IEEE-ACM
16 years 1 months ago
2007
IEEE-ACM
This paper describes the Korat tool for constraint-based generation of structurally complex test inputs for Java programs. Korat takes (1) an imperative predicate that specifies t...
108
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ICCAD
1998
IEEE
15 years 5 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
AIPS
2000
15 years 2 months ago
2000
Graphical user interfaces (GUIs) have become nearly ubiquitous as a means of interacting with software systems. GUIs are typically highly complex pieces of software, and testing t...
107
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ICCAD
2002
IEEE
15 years 10 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...