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133
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APSEC
2004
IEEE
15 years 5 months ago
2004
IEEE
Unit testing is a methodology for testing small parts of an application independently of whatever application uses them. It is time consuming and tedious to write unit tests, and ...
140
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ATS
1998
IEEE
15 years 5 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
SGAI
2005
Springer
15 years 6 months ago
2005
Springer
SkillSum is an Artificial Intelligence (AI) and Natural Language Generation (NLG) system that produces short feedback reports for people who are taking online tests which check th...
105
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ECBS
2005
IEEE
15 years 7 months ago
2005
IEEE
Testing complex Computer-Based Systems is not only a demanding but a very critical task. Therefore the use of models for generating test data is an important goal. Tool support du...
115
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CP
1998
Springer
15 years 5 months ago
1998
Springer
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...