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FUIN
2007
147views more  FUIN 2007»
15 years 1 months ago
Privacy Preserving Database Generation for Database Application Testing
Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively few efforts ...
Xintao Wu, Yongge Wang, Songtao Guo, Yuliang Zheng
TSE
2010
155views more  TSE 2010»
14 years 8 months ago
Incremental Test Generation for Software Product Lines
Recent advances in mechanical techniques for systematic testing have increased our ability to automatically find subtle bugs, and hence to deploy more dependable software. This pap...
Engin Uzuncaova, Sarfraz Khurshid, Don S. Batory
VLSID
2010
IEEE
155views VLSI» more  VLSID 2010»
14 years 11 months ago
Synchronized Generation of Directed Tests Using Satisfiability Solving
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
Xiaoke Qin, Mingsong Chen, Prabhat Mishra
DATE
1998
IEEE
92views Hardware» more  DATE 1998»
15 years 5 months ago
Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis...
FATES
2004
Springer
15 years 5 months ago
Test Generation Based on Symbolic Specifications
Abstract. Classical state-oriented testing approaches are based on simple machine models such as Labelled Transition Systems (LTSs), in which data is represented by concrete values...
Lars Frantzen, Jan Tretmans, Tim A. C. Willemse