5855 search results - page 82 / 1171 » Test generation and minimization with |
ENTCS
2007
15 years 1 months ago
2007
Modern software is increasingly concurrent, timed, distributed, and therefore, non-deterministic. While it is well known that tests can be generated as LTL or CTL model checker co...
134
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CP
2009
Springer
15 years 4 months ago
2009
Springer
Abstract. This paper considers the automatic generation of architectural tests (ATGP), a fundamental problem in processor validation. ATGPs are complex conditional constraint satis...
DDECS
2007
IEEE
15 years 7 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
110
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GLVLSI
2002
IEEE
15 years 6 months ago
2002
IEEE
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
DATE
2005
IEEE
15 years 7 months ago
2005
IEEE
Our goal is to produce validation data that can be used as an efficient (pre) test set for structural stuck-at faults. In this paper, we detail an original test-oriented mutation ...