5855 search results - page 89 / 1171 » Test generation and minimization with |
ASPDAC
2005
ACM
15 years 7 months ago
2005
ACM
- This paper extends the depth first search (DFS) used in the previously proposed witness string method for generating efficient test vectors. A state pruning method is added that ...
135
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KBSE
2005
IEEE
15 years 7 months ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
ICCD
2006
IEEE
15 years 10 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
107
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DAC
1994
ACM
15 years 5 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...