5855 search results - page 91 / 1171 » Test generation and minimization with |
115
click to vote
ISMVL
2005
IEEE
15 years 7 months ago
2005
IEEE
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
107
click to vote
TCAD
2002
15 years 1 months ago
2002
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...
108
click to vote
VLSID
2009
IEEE
16 years 2 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
114
click to vote
EVOW
2009
Springer
15 years 4 months ago
2009
Springer
Abstract. The testing of anomaly detectors is considered from the perspective of a Multi-objective Evolutionary Exploit Generator (EEG). Such a framework provides users of anomaly ...
132
click to vote
EVOW
2001
Springer
15 years 6 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...