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ET
1998
15 years 1 months ago
1998
Defining information required by automatic test systems frequently involves a description of system behavior. To facilitate capturing the required behavior information in the cont...
113
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VLSID
2007
IEEE
16 years 1 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
130
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DATE
2005
IEEE
15 years 7 months ago
2005
IEEE
This paper presents an infrastructure to test the functionality of the specific architectures output by a highlevel compiler targeting dynamically reconfigurable hardware. It resu...
CORR
2004
Springer
15 years 1 months ago
2004
Springer
This paper describes the Patent Retrieval Task in the Fourth NTCIR Workshop, and the test collections produced in this task. We perform the invalidity search task, in which each p...
125
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EURODAC
1994
IEEE
15 years 5 months ago
1994
IEEE
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...