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105
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MTDT
2003
IEEE
15 years 6 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
103
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PTS
1993
15 years 2 months ago
1993
The signal SAVE construct is one of the features distinguishing SDL from convent specification and programming languages. On the other hand, this feature increase testing SDL-spec...
132
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ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
14 years 11 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
108
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SE
2008
15 years 2 months ago
2008
We propose a new method for system validation by means of testing, which is based on environment models expressed as UML state machines. A sun blind control case study serves to il...
107
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DELTA
2002
IEEE
15 years 6 months ago
2002
IEEE
A DSP technique that transforms a digital signal by warping the frequency axis is discussed. The technique corresponds to a mapping of the samples in the z-domain such that they a...