Sciweavers

143 search results - page 2 / 29
» Test generation for designs with multiple clocks
Sort
View
70
Voted
ASPDAC
2007
ACM
82views Hardware» more  ASPDAC 2007»
15 years 1 months ago
Efficient BMC for Multi-Clock Systems with Clocked Specifications
- Current industry trends in system design -- multiple clocks, clocks with arbitrary frequency ratios, multi-phased clocks, gated clocks, and level-sensitive latches, combined with...
Malay K. Ganai, Aarti Gupta
ICCAD
2003
IEEE
135views Hardware» more  ICCAD 2003»
15 years 2 months ago
ATPG for Noise-Induced Switch Failures in Domino Logic
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
Rahul Kundu, R. D. (Shawn) Blanton
DSD
2008
IEEE
115views Hardware» more  DSD 2008»
15 years 4 months ago
An Efficient Multiple-Parity Generator Design for On-Line Testing on FPGA
We propose a method to efficiently design a “parity generator”, which is a stand-alone block producing multiple parity bits of a given circuit. The parity generator is designe...
Petr Fiser, Pavel Kubalík, Hana Kubatova
DAC
2000
ACM
15 years 10 months ago
Power minimization using control generated clocks
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...
M. Srikanth Rao, S. K. Nandy
FMICS
2008
Springer
14 years 11 months ago
Extending Structural Test Coverage Criteria for Lustre Programs with Multi-clock Operators
Lustre is a formal synchronous declarative language widely used for modeling and specifying safety-critical applications in the elds of avionics, transportation or energy productio...
Virginia Papailiopoulou, Laya Madani, Lydie du Bou...