693 search results - page 11 / 139 » Test of Future System-on-Chips |
SIGCOMM
2012
ACM
13 years 4 days ago
2012
ACM
We present a methodology that brings simplicity to large and comt labs by using abstraction. The networking community has appreciated the value of large scale test labs to explore...
DATE
2006
IEEE
15 years 3 months ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
FATES
2004
Springer
15 years 3 months ago
2004
Springer
We present the development of T-UPPAAL — a new tool for online black-box testing of real-time embedded systems from non-deterministic timed automata specifications. It is based ...
CLIN
2001
14 years 11 months ago
2001
This paper describes the first large-scale evaluation of information retrieval systems using Dutch documents and queries. We describe in detail the characteristics of the Dutch te...