693 search results - page 23 / 139 » Test of Future System-on-Chips |
IOLTS
2007
IEEE
15 years 4 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Publication
When preparing students for an industrial or academic career in software engineering, educational institutions need to address the globally distributed character of the software en...
MSS
2000
IEEE
15 years 2 months ago
2000
IEEE
The InTENsity PowerWall is a display system used for high-resolution visualization of very large volumetric data sets. The display is linked to two separate computing environments...
VLSID
2007
IEEE
15 years 10 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
WSC
2004
14 years 11 months ago
2004
The Virtual Test Bed (VTB) is a prototype of a virtual engineering environment to study operations of current and future space vehicles, spaceports, and ranges. The HighLevel Arch...