502 search results - page 10 / 101 » Test pattern generation based on arithmetic operations |
124
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DAC
1997
ACM
15 years 6 months ago
1997
ACM
—Many application-specific architectures provide indirect addressing modes with auto-increment/decrement arithmetic. Since these architectures generally do not feature an indexe...
124
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MICS
2007
15 years 1 months ago
2007
A new algorithm for real root isolation of univariate polynomials is proposed, which is mainly based on exact interval arithmetic and bisection method. Although exact interval arit...
107
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DATE
2005
IEEE
15 years 7 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
119
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ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
110
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ETS
2009
IEEE
14 years 11 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...