502 search results - page 12 / 101 » Test pattern generation based on arithmetic operations |
INFORMATICALT
2007
15 years 1 months ago
2007
Abstract. The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for ...
107
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ITC
1995
IEEE
15 years 5 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
133
Voted
TEC
2002
15 years 1 months ago
2002
Abstract--In this paper, we present an efficient graph-based evolutionary optimization technique called evolutionary graph generation (EGG) and the proposed approach is applied to ...
102
Voted
DDECS
2007
IEEE
15 years 8 months ago
2007
IEEE
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
138
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KBSE
2005
IEEE
15 years 7 months ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...