502 search results - page 13 / 101 » Test pattern generation based on arithmetic operations |
VTS
1999
IEEE
15 years 6 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
139
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ICRA
2007
IEEE
15 years 8 months ago
2007
IEEE
— This article presents a control architecture for controlling the locomotion of an amphibious snake/lamprey robot capable of swimming and serpentine locomotion. The control arch...
121
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JSS
2008
15 years 9 days ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...
105
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DATE
2000
IEEE
15 years 6 months ago
2000
IEEE
We describe a method for on-chip generation of weighted test sequences for synchronous sequential circuits. For combinational circuits, three weights, 0, 0.5 and 1, are sufficien...
123
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APIN
2000
15 years 1 months ago
2000
The use of genetic programming for probabilistic pattern matching is investigated. A stochastic regular expression language is used. The language features a statistically sound sem...