502 search results - page 16 / 101 » Test pattern generation based on arithmetic operations |
168
Voted
ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
112
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VTS
1999
IEEE
15 years 6 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
129
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ICCAD
2003
IEEE
15 years 7 months ago
2003
IEEE
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
118
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FATES
2004
Springer
15 years 7 months ago
2004
Springer
We present an extension of Tretmans’ theory and algorithm for test generation for input-output transition systems to real-time systems. Our treatment is based on an operational i...
133
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TACAS
2007
Springer
15 years 8 months ago
2007
Springer
ion Randal E. Bryant1 , Daniel Kroening2 , Jo¨el Ouaknine3 , Sanjit A. Seshia4 , Ofer Strichman5 , and Bryan Brady4 1 Carnegie Mellon University, Pittsburgh 2 ETH Z¨urich 3 Oxfor...