502 search results - page 17 / 101 » Test pattern generation based on arithmetic operations |
104
Voted
DATE
2009
IEEE
15 years 8 months ago
2009
IEEE
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
159
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ITC
1997
IEEE
15 years 6 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
83
Voted
ITC
1998
IEEE
15 years 6 months ago
1998
IEEE
This work proposes an approach to generate weighted random patterns which can maximally excite a circuit during its burn-in testing. The approach is based on a probability model a...
120
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ECP
1999
Springer
15 years 6 months ago
1999
Springer
We extend a planning algorithm to cover simple forms of arithmetics. The operator preconditions can refer to the values of numeric variables and the operator postconditions can mod...
100
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PATMOS
2004
Springer
15 years 7 months ago
2004
Springer
The main result is the development, and delay comparison based on Logical Effort, of a number of high speed circuits for common arithmetic and related operations using threshold l...