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» Test pattern generation based on arithmetic operations
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136
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ICDE
2011
IEEE
220views Database» more  ICDE 2011»
14 years 5 months ago
Generating test data for killing SQL mutants: A constraint-based approach
—Complex SQL queries are widely used today, but it is rather difficult to check if a complex query has been written correctly. Formal verification based on comparing a specifi...
Shetal Shah, S. Sudarshan, Suhas Kajbaje, Sandeep ...
200
Voted
CP
2009
Springer
16 years 2 months ago
Constraint-Based Optimal Testing Using DNNF Graphs
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
Anika Schumann, Martin Sachenbacher, Jinbo Huang
VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
16 years 2 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
120
Voted
KBSE
2010
IEEE
15 years 8 days ago
Test generation to expose changes in evolving programs
Software constantly undergoes changes throughout its life cycle, and thereby it evolves. As changes are introduced into a code base, we need to make sure that the effect of the ch...
Dawei Qi, Abhik Roychoudhury, Zhenkai Liang
123
Voted
ICSM
2005
IEEE
15 years 7 months ago
An Empirical Comparison of Test Suite Reduction Techniques for User-Session-Based Testing of Web Applications
Automated cost-effective test strategies are needed to provide reliable, secure, and usable web applications. As a software maintainer updates an application, test cases must accu...
Sara Sprenkle, Sreedevi Sampath, Emily Gibson, Lor...