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» Test pattern generation based on arithmetic operations
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120
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SEW
2007
IEEE
15 years 8 months ago
Testing Patterns
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
Neelam Soundarajan, Jason O. Hallstrom, Adem Delib...
129
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EURODAC
1995
IEEE
159views VHDL» more  EURODAC 1995»
15 years 5 months ago
The VHDL based design of the MIDA MPEG1 audio decoder
This paper describes the features and design methodology of MIDA, a MPEG1 integrated audio decoder. MIDA has been almost completely designed using automatic synthesis of VHDL desc...
Andrea Finotello, Maurizio Paolini
107
Voted
IOLTS
2007
IEEE
120views Hardware» more  IOLTS 2007»
15 years 8 months ago
Accelerating Soft Error Rate Testing Through Pattern Selection
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu
121
Voted
JSW
2007
156views more  JSW 2007»
15 years 1 months ago
An Automatic Test Case Generation Framework for Web Services
— BPEL (Business Process Execution Language) as a de-facto standard for web service orchestration has drawn particularly attention from researchers and industries. BPEL is a semi...
Yongyan Zheng, Jiong Zhou, Paul Krause
IJON
2007
118views more  IJON 2007»
15 years 1 months ago
Low power CMOS electronic central pattern generator design for a biomimetic underwater robot
— This paper, presents a feasability study of a central pattern generator-based analog controller for an autonomous robot. The operation of a neuronal circuit formed of electroni...
Young-Jun Lee, Jihyun Lee, Kyung Ki Kim, Yong-Bin ...