502 search results - page 21 / 101 » Test pattern generation based on arithmetic operations |
113
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CONSTRAINTS
2007
15 years 1 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
164
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SIGGRAPH
1992
ACM
15 years 6 months ago
1992
ACM
This paper discusses a new, symbolic approach to geometric modeling called generative modeling. The approach allows specification, rendering, and analysis of a wide variety of sha...
105
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DCC
1995
IEEE
15 years 5 months ago
1995
IEEE
A JBIG compliant, quadtree based, lossless image compression algorithm is described. In terms of the number of arithmetic coding operations required to code an image, this algorit...
114
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GLVLSI
2002
IEEE
15 years 6 months ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
107
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GG
2008
Springer
15 years 2 months ago
2008
Springer
We present a new, high-level approach for the specification of model-to-model transformations based on declarative patterns. These are (atomic or composite) constraints on triple ...